In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.

Material fabrication processes can gradually create changes in the material’s final properties; thus, to verify the material’s final quality and comprehend any inconsistencies, scientists need a ...

When thinking of celebrated technological innovations, it is perhaps rare that we consider the role of material scientists: the unsung heroes of advancement. Nonetheless, it is the great work of these ...